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Sep 12, 2024
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2024-2025 University Catalog
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E E 671 - VLSI Testing Units: 3
Grading Method: LTR: Letter Graded. The class will be offered for letter grade with no option to take it for Cr/NC
Prerequisite(s): COMPE 470
Theory and techniques for testing VLSI circuits and systems. Analog/mixed-signal testing, Automatic Test Pattern Generation (ATPG), boundary scan and core-based testing, Built-in Self-Test (BIST), defect and fault diagnosis, Design For Testability (DFT), logic/fault simulation, memory test, machine learning applications in VLSI testing, scan design/architecture.
Maximum Credits: 3
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