E E 671 - VLSI Testing

Units: 3

Grading Method: LTR: Letter Graded. The class will be offered for letter grade with no option to take it for Cr/NC

Prerequisite(s): COMPE 470

Theory and techniques for testing VLSI circuits and systems. Analog/mixed-signal testing, Automatic Test Pattern Generation (ATPG), boundary scan and core-based testing, Built-in Self-Test (BIST), defect and fault diagnosis, Design For Testability (DFT), logic/fault simulation, memory test, machine learning applications in VLSI testing, scan design/architecture.

Maximum Credits: 3